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Thermal-Aware Testing of Digital VLSI Circuits and Systems
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Thermal-Aware Testing of Digital VLSI Circuits and Systems

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Product Overview

Highlights

  • Original copy from the publisher

Specifications

PublisherTaylor & Francis
ISBN 10815378823
AuthorSantanu Chattopadhyay, Sharron E. Dr. PhD RN Guillett
LanguageEnglish
Edition Number1
Number of PagesNULL
ISBN 139780815378822
Book DescriptionThermal-Aware Testing of Digital VLSI Circuits and Systems by Santanu Chattopadhyay - Publishing House Taylor & Francis Year : 2018 -The International Standard Book Number (ISBN) is : 9780815378822
Book FormatPaperback
Book SubtitleNULL
Publication Date2018
Thermal-Aware Testing of Digital VLSI Circuits and Systems
Thermal-Aware Testing of Digital VLSI Circuits and Systems
Sorry! This product is not available.
Available Soon

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