• usp_easy_retunsFree & Easy Returns
  • usp_best_dealsBest Deals

Electron Beam Testing Technology

959.00
Inclusive of VAT
nudge icon
Free Delivery
nudge icon
Free Delivery
noon-marketplace
Get it by 4 July
Order in 17 h 11 m
Delivery 
by noon
Delivery by noon
Cash on 
Delivery
Cash on Delivery
Secure
Transaction
Secure Transaction
placeholder
/emkan/
Product Overview
Specifications
PublisherSpringer; Softcover Reprint of the Original 1st 1993 ed. edition
ISBN 139781489915245
ISBN 101489915249
AuthorJohn T.L. Thong
Book FormatPaperback
LanguageEnglish
Book DescriptionAlthough exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
Publication Date4 June 2013
Number of Pages480 pages
Cart Total  959.00

We're Always Here To Help

Reach out to us through any of these support channels

Shop On The Go

App StoreGoogle PlayHuawei App Gallery

Connect With Us

madamastercardvisatabbytamaraamexcod
Noon E Commerce Solutions One Person Company LLCCR No. 1010703009VAT No. 302004655210003