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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas
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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas
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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas

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Product Overview

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Publisherde Gruyter
ISBN 103110456214
LanguageEnglish
About the AuthorRobert Dinnebier, MPI for Solid State Res., Ger.; Andreas Leineweber, TU Bergakademie Freiberg, Ger.; John S.O. Evans, Durham Univ., UK.
Number of Pages347 pages
ISBN 139783110456219
AuthorRobert E Dinnebier
Book DescriptionThe authors discuss the powerful and well established Rietveld Method for X-ray powder diffraction. Theoretical background and practical approach are given for all steps of the structure refinement.
Publication Date17 December 2018
Cart Total  597.00
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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas
Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas
597.00
0

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