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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

269.00
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المواصفات

الناشرCRC Press
رقم الكتاب المعياري الدولي 101032375116
تنسيق الكتابPaperback
وصف الكتابThe book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
عدد الصفحات130 pages
رقم الكتاب المعياري الدولي 139781032375113
الكاتبCh Sateesh Kumar
اللغةEnglish
تاريخ النشر29 November 2024
مجموع السلة  269.00
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
269.00
الكمية قليل: باقي 1 فقط
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