الناشر | Springer; Softcover reprint of hardcover 1st ed. 2005 edition |
رقم الكتاب المعياري الدولي 10 | 1441952691 |
تنسيق الكتاب | Paperback |
وصف الكتاب | Testing Concepts.- Design Flow.- Design for Test.- Boundary Scan.- SOC Design for Testability.- System Modeling.- Test Conflicts.- Test Power Dissipation.- Test Access Mechanism.- Test Scheduling.- SOC Test Applications.- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling.- An Integrated Framework for the Design and Optimization of SOC Test Solutions.- Efficient Test Solutions for Core-Based Designs.- Core Selection in the SOC Test Design-Flow.- Defect-Aware Test Scheduling.- An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint. |
تاريخ النشر | 2 February 2011 |
رقم الكتاب المعياري الدولي 13 | 9781441952691 |
الكاتب | Erik Larsson |
اللغة | English |
عن المؤلف | Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies |
عدد الصفحات | 410 pages |