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New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
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New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)

EGP574.00
EGP 861.00
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Product Overview

Highlights

  • Orginal - New

Specifications

PublisherElsevier
AuthorZeev Zalevsky, Pavel Livshits, Eran Gur
LanguageEnglish
Edition Number1
ISBN 139780323241434
Book FormatPaperback
Book DescriptionNew Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies) BY Zeev Zalevsky, Pavel Livshits, Eran Gur - PublisherElsevier - Copyright: 2014 - ISBN: 9780323241434
Publication Date2014
Cart Total EGP 574.00
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New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
EGP574.00
EGP 86133%
Low stock: only 2 left
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